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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/RuizFGM12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ignacio_Gil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jose_Mar%E2%88%9A%E2%89%A0a_Ru%E2%88%9A%E2%89%A0z>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marta_Morata>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ra%E2%88%9A%C4%BCl_Fern%E2%88%9A%C2%B0ndez-Garc%E2%88%9A%E2%89%A0a>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-012-5337-9>
foaf:homepage <https://doi.org/10.1007/s10836-012-5337-9>
dc:identifier DBLP journals/et/RuizFGM12 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-012-5337-9 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ignacio_Gil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jose_Mar%E2%88%9A%E2%89%A0a_Ru%E2%88%9A%E2%89%A0z>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marta_Morata>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ra%E2%88%9A%C4%BCl_Fern%E2%88%9A%C2%B0ndez-Garc%E2%88%9A%E2%89%A0a>
swrc:number 6 (xsd:string)
swrc:pages 865-868 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/RuizFGM12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/RuizFGM12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et28.html#RuizFGM12>
rdfs:seeAlso <https://doi.org/10.1007/s10836-012-5337-9>
dc:title Current Consumption and Power Integrity of CMOS Digital Circuits Under NBTI Wearout. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 28 (xsd:string)