A Novel RF Test Scheme Based on a DFT Method.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/RyuKS06
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dcterms:
bibliographicCitation
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Iboun_Taimiya_Sylla
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https://dblp.l3s.de/d2r/resource/authors/Jee-Youl_Ryu
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DBLP journals/et/RyuKS06
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DOI doi.org%2F10.1007%2Fs10836-006-7823-4
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issued
2006
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swrc:
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rdfs:
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A Novel RF Test Scheme Based on a DFT Method.
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swrc:
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3
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pages
229-237
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dc:
subject
RF design-for-testability; RF test; low noise amplifier; defects; known-good-die
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title
A Novel RF Test Scheme Based on a DFT Method.
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22
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