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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/Saluja94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00972520>
foaf:homepage <https://doi.org/10.1007/BF00972520>
dc:identifier DBLP journals/et/Saluja94 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00972520 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label On-chip testing of random access memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
swrc:number 4 (xsd:string)
swrc:pages 367-376 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/Saluja94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/Saluja94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et5.html#Saluja94>
rdfs:seeAlso <https://doi.org/10.1007/BF00972520>
dc:subject BIST RAM; Built-In Self-Test; pattern sensitive faults; RAM testing; reconfigured random access memories; test architectures; test parallelism (xsd:string)
dc:title On-chip testing of random access memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 5 (xsd:string)