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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/SantosGTT01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fernando_M._Gon%E2%88%9A%C3%9Falves>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Isabel_C._Teixeira>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_Paulo_Teixeira_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marcelino_B._Santos>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1012223614418>
foaf:homepage <https://doi.org/10.1023/A:1012223614418>
dc:identifier DBLP journals/et/SantosGTT01 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1012223614418 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fernando_M._Gon%E2%88%9A%C3%9Falves>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Isabel_C._Teixeira>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jo%E2%88%9A%C2%A3o_Paulo_Teixeira_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marcelino_B._Santos>
swrc:number 3-4 (xsd:string)
swrc:pages 311-319 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/SantosGTT01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/SantosGTT01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et17.html#SantosGTT01>
rdfs:seeAlso <https://doi.org/10.1023/A:1012223614418>
dc:subject RTL; test generation; Defect-Oriented Test (DOT); low-energy test (xsd:string)
dc:title RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 17 (xsd:string)