On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/SantosTTMBF04
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dcterms:
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DBLP journals/et/SantosTTMBF04
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DOI doi.org%2F10.1023%2FB%3AJETT.0000039603.89172.2e
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dcterms:
issued
2004
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rdfs:
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On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level.
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4
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345-355
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dc:
subject
RTL; BIST; defects-based test; low-power; test quality
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On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level.
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