Delay Test Generation: A Hardware Perspective. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/et/Savir97>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008219725676>
foaf:homepage	<https://doi.org/10.1023/A:1008219725676>
dc:identifier	DBLP journals/et/Savir97 (xsd:string)
dc:identifier	DOI doi.org%2F10.1023%2FA%3A1008219725676 (xsd:string)
dcterms:issued	1997 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label	Delay Test Generation: A Hardware Perspective. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
swrc:number	3 (xsd:string)
swrc:pages	245-254 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/et/Savir97/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/et/Savir97>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/et/et10.html#Savir97>
rdfs:seeAlso	<https://doi.org/10.1023/A:1008219725676>
dc:subject	delay test; linear feedback shift register; cellular automata; transition test; skewed-load delay test; shift dependency; pseudo-random test (xsd:string)
dc:title	Delay Test Generation: A Hardware Perspective. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	10 (xsd:string)