Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path Connections.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/Savir99
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/Savir99
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir
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foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008345026085
>
foaf:
homepage
<
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dc:
identifier
DBLP journals/et/Savir99
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1023%2FA%3A1008345026085
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dcterms:
issued
1999
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/et
>
rdfs:
label
Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path Connections.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir
>
swrc:
number
3
(xsd:string)
swrc:
pages
279-296
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/et/Savir99/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/et/Savir99
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/et/et15.html#Savir99
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rdfs:
seeAlso
<
https://doi.org/10.1023/A:1008345026085
>
dc:
subject
signal probability; detection probability; exposure probability; escape probability; Markov chain; random patterns
(xsd:string)
dc:
title
Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path Connections.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
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rdf:
type
swrc:Article
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foaf:Document
swrc:
volume
15
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