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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/SchubertA00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/A._Schubert>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Walter_Anheier>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008378912411>
foaf:homepage <https://doi.org/10.1023/A:1008378912411>
dc:identifier DBLP journals/et/SchubertA00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008378912411 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label On Random Pattern Testability of Cryptographic VLSI Cores. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/A._Schubert>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Walter_Anheier>
swrc:number 3 (xsd:string)
swrc:pages 185-192 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/SchubertA00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/SchubertA00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#SchubertA00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008378912411>
dc:subject pseudorandom testing; built-in self-test; testing of cores; test-ready intellectual property (xsd:string)
dc:title On Random Pattern Testability of Cryptographic VLSI Cores. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)