Quiescent current analysis and experimentation of defective CMOS circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/SeguraCRFR92
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1992
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Quiescent current analysis and experimentation of defective CMOS circuits.
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337-348
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Bridging failures; current testing; defect modeling; floating gate opens; gate oxide shorts; intentionally designed defective circuits defects
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Quiescent current analysis and experimentation of defective CMOS circuits.
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