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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/SemenovVS03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arman_Vassighi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Manoj_Sachdev>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Oleg_Semenov>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1023713517064>
foaf:homepage <https://doi.org/10.1023/A:1023713517064>
dc:identifier DBLP journals/et/SemenovVS03 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1023713517064 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arman_Vassighi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Manoj_Sachdev>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Oleg_Semenov>
swrc:number 3 (xsd:string)
swrc:pages 341-352 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/SemenovVS03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/SemenovVS03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et19.html#SemenovVS03>
rdfs:seeAlso <https://doi.org/10.1023/A:1023713517064>
dc:subject CMOS integrated circuits; I DDQ testing; quality; reliability; MOSFET leakage (xsd:string)
dc:title Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 19 (xsd:string)