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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ShenL90>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Lombardi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yinan_N._Shen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00134014>
foaf:homepage <https://doi.org/10.1007/BF00134014>
dc:identifier DBLP journals/et/ShenL90 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00134014 (xsd:string)
dcterms:issued 1990 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Lombardi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yinan_N._Shen>
swrc:number 1 (xsd:string)
swrc:pages 43-57 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ShenL90/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ShenL90>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et1.html#ShenL90>
rdfs:seeAlso <https://doi.org/10.1007/BF00134014>
dc:subject diagnosis; redundant memory; repair; WSI; yield (xsd:string)
dc:title Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 1 (xsd:string)