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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ShethS04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Amit_M._Sheth>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FB%3AJETT.0000023683.62501.ed>
foaf:homepage <https://doi.org/10.1023/B:JETT.0000023683.62501.ed>
dc:identifier DBLP journals/et/ShethS04 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FB%3AJETT.0000023683.62501.ed (xsd:string)
dcterms:issued 2004 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Scan Latch Design for Test Applications. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Amit_M._Sheth>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacob_Savir>
swrc:number 2 (xsd:string)
swrc:pages 213-216 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ShethS04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ShethS04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et20.html#ShethS04>
rdfs:seeAlso <https://doi.org/10.1023/B:JETT.0000023683.62501.ed>
dc:subject scan design; LSSD; shift register latch; hardware overhead (xsd:string)
dc:title Scan Latch Design for Test Applications. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)