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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/SinghPPP06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhishek_Singh_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chintan_Patel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dhananjay_S._Phatak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jim_Plusquellic>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-9318-8>
foaf:homepage <https://doi.org/10.1007/s10836-006-9318-8>
dc:identifier DBLP journals/et/SinghPPP06 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-006-9318-8 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Defect Simulation Methodology for iDDT Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhishek_Singh_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chintan_Patel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dhananjay_S._Phatak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jim_Plusquellic>
swrc:number 3 (xsd:string)
swrc:pages 255-272 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/SinghPPP06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/SinghPPP06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et22.html#SinghPPP06>
rdfs:seeAlso <https://doi.org/10.1007/s10836-006-9318-8>
dc:subject defect simulation; fault simulation; defect-based test; iDDT; IDDQ; transient current testing; device testing; ATPG (xsd:string)
dc:title Defect Simulation Methodology for iDDT Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)