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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/SodenHGM92>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Charles_F._Hawkins>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jerry_M._Soden>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ravi_K._Gulati>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Weiwei_Mao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00135333>
foaf:homepage <https://doi.org/10.1007/BF00135333>
dc:identifier DBLP journals/et/SodenHGM92 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00135333 (xsd:string)
dcterms:issued 1992 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label IDDQ testing: A review. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Charles_F._Hawkins>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jerry_M._Soden>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ravi_K._Gulati>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Weiwei_Mao>
swrc:number 4 (xsd:string)
swrc:pages 291-303 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/SodenHGM92/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/SodenHGM92>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et3.html#SodenHGM92>
rdfs:seeAlso <https://doi.org/10.1007/BF00135333>
dc:subject CMOS IC; I DDQ; Current testing; IC quality; defects; fault models (xsd:string)
dc:title IDDQ testing: A review. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 3 (xsd:string)