Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/StopjakovaMMMM04
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2004
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Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks.
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analog test; supply current monitoring; catastrophic faults; artificial neural networks
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Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks.
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