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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/StroudB93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmed_E._Barbour>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Charles_E._Stroud>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00971970>
foaf:homepage <https://doi.org/10.1007/BF00971970>
dc:identifier DBLP journals/et/StroudB93 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00971970 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Testability and test generation for majority voting fault-tolerant circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmed_E._Barbour>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Charles_E._Stroud>
swrc:number 3 (xsd:string)
swrc:pages 201-214 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/StroudB93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/StroudB93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et4.html#StroudB93>
rdfs:seeAlso <https://doi.org/10.1007/BF00971970>
dc:subject Design for testability; fault-tolerance; majority voting circuits; multiple stuck-at faults; test pattern generation (xsd:string)
dc:title Testability and test generation for majority voting fault-tolerant circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 4 (xsd:string)