[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/StroudBE00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Charles_E._Stroud>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/James_R._Bailey>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Johan_R._Emmert>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008377405040>
foaf:homepage <https://doi.org/10.1023/A:1008377405040>
dc:identifier DBLP journals/et/StroudBE00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008377405040 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A New Method for Testing Re-Programmable PLAs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Charles_E._Stroud>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/James_R._Bailey>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Johan_R._Emmert>
swrc:number 6 (xsd:string)
swrc:pages 635-640 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/StroudBE00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/StroudBE00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#StroudBE00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008377405040>
dc:subject electrically erasable programmable logic array testing; manufacturing test development; bridging faults (xsd:string)
dc:title A New Method for Testing Re-Programmable PLAs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)