Testing of static random access memories by monitoring dynamic power supply current.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/SuM92
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bibliographicCitation
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dc:
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https://dblp.l3s.de/d2r/resource/authors/Shyang-Tai_Su
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DBLP journals/et/SuM92
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1992
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Testing of static random access memories by monitoring dynamic power supply current.
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3
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265-278
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dc:
subject
Current-testable design; dynamic current monitors; dynamic power supply current; fault modeling; pattern sensitivity
(xsd:string)
dc:
title
Testing of static random access memories by monitoring dynamic power supply current.
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