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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/SuMN95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H._Troy_Nagle>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shyang-Tai_Su>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00993128>
foaf:homepage <https://doi.org/10.1007/BF00993128>
dc:identifier DBLP journals/et/SuMN95 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00993128 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Transient power supply current monitoring - A new test method for CMOS VLSI circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H._Troy_Nagle>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rafic_Z._Makki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shyang-Tai_Su>
swrc:number 1 (xsd:string)
swrc:pages 23-43 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/SuMN95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/SuMN95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et6.html#SuMN95>
rdfs:seeAlso <https://doi.org/10.1007/BF00993128>
dc:subject Design for current-testability; drain/source opens; floating gates; shorts; transient power supply current (xsd:string)
dc:title Transient power supply current monitoring - A new test method for CMOS VLSI circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 6 (xsd:string)