On Using Twisted-Ring Counters for Test Set Embedding in BIST.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/SwaminathanC01
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Value
dcterms:
bibliographicCitation
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http://dblp.uni-trier.de/rec/bibtex/journals/et/SwaminathanC01
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dc:
creator
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https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty
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dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shivakumar_Swaminathan
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homepage
<
http://dx.doi.org/doi.org%2F10.1023%2FA%3A1012872706123
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foaf:
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dc:
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DBLP journals/et/SwaminathanC01
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dc:
identifier
DOI doi.org%2F10.1023%2FA%3A1012872706123
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dcterms:
issued
2001
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On Using Twisted-Ring Counters for Test Set Embedding in BIST.
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https://dblp.l3s.de/d2r/resource/authors/Shivakumar_Swaminathan
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swrc:
number
6
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swrc:
pages
529-542
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http://bibsonomy.org/uri/bibtexkey/journals/et/SwaminathanC01/dblp
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rdfs:
seeAlso
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rdfs:
seeAlso
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https://doi.org/10.1023/A:1012872706123
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dc:
subject
deterministic BIST; non-intrusive testing; reseeding; scalable BIST; test-per-clock
(xsd:string)
dc:
title
On Using Twisted-Ring Counters for Test Set Embedding in BIST.
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swrc:Article
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17
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