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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/SwaminathanKC97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruce_C._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Madhavan_Swaminathan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008214330042>
foaf:homepage <https://doi.org/10.1023/A:1008214330042>
dc:identifier DBLP journals/et/SwaminathanKC97 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008214330042 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A Survey of Test Techniques for MCM Substrates. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruce_C._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Madhavan_Swaminathan>
swrc:number 1-2 (xsd:string)
swrc:pages 27-38 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/SwaminathanKC97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/SwaminathanKC97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et10.html#SwaminathanKC97>
rdfs:seeAlso <https://doi.org/10.1023/A:1008214330042>
dc:subject multi-chip module; interconnect test; MCM substrates; known-good-die (xsd:string)
dc:title A Survey of Test Techniques for MCM Substrates. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 10 (xsd:string)