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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/Ubar03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Raimund_Ubar>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1021948013402>
foaf:homepage <https://doi.org/10.1023/A:1021948013402>
dc:identifier DBLP journals/et/Ubar03 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1021948013402 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Design Error Diagnosis with Re-Synthesis in Combinational Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Raimund_Ubar>
swrc:number 1 (xsd:string)
swrc:pages 73-82 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/Ubar03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/Ubar03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et19.html#Ubar03>
rdfs:seeAlso <https://doi.org/10.1023/A:1021948013402>
dc:subject design error; diagnosis; fault simulation; test generation (xsd:string)
dc:title Design Error Diagnosis with Re-Synthesis in Combinational Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 19 (xsd:string)