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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/VirazelDGLP01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ren%E2%88%9A%C2%A9_David>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1012259227622>
foaf:homepage <https://doi.org/10.1023/A:1012259227622>
dc:identifier DBLP journals/et/VirazelDGLP01 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1012259227622 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Arnaud_Virazel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Christian_Landrault>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Patrick_Girard_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ren%E2%88%9A%C2%A9_David>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Serge_Pravossoudovitch>
swrc:number 3-4 (xsd:string)
swrc:pages 233-241 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/VirazelDGLP01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/VirazelDGLP01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et17.html#VirazelDGLP01>
rdfs:seeAlso <https://doi.org/10.1023/A:1012259227622>
dc:subject delay testing; random testing; robust test; non-robust test; BIST (xsd:string)
dc:title Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 17 (xsd:string)