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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/VoyiatzisPNH96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonis_M._Paschalis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Constantin_Halatsis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitris_Nikolos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF02341826>
foaf:homepage <https://doi.org/10.1007/BF02341826>
dc:identifier DBLP journals/et/VoyiatzisPNH96 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF02341826 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label An efficient built-in self test method for robust path delay fault testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonis_M._Paschalis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Constantin_Halatsis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitris_Nikolos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
swrc:number 2 (xsd:string)
swrc:pages 219-222 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/VoyiatzisPNH96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/VoyiatzisPNH96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et8.html#VoyiatzisPNH96>
rdfs:seeAlso <https://doi.org/10.1007/BF02341826>
dc:subject built-in self test; two-pattern test generator; single-input change pattern testing; robust path delay faults (xsd:string)
dc:title An efficient built-in self test method for robust path delay fault testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 8 (xsd:string)