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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/VoyiatzisPNH99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonis_M._Paschalis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Constantin_Halatsis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitris_Nikolos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008340925177>
foaf:homepage <https://doi.org/10.1023/A:1008340925177>
dc:identifier DBLP journals/et/VoyiatzisPNH99 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008340925177 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label An Accumulator-Based BIST Approach for Two-Pattern Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonis_M._Paschalis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Constantin_Halatsis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitris_Nikolos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Voyiatzis>
swrc:number 3 (xsd:string)
swrc:pages 267-278 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/VoyiatzisPNH99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/VoyiatzisPNH99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et15.html#VoyiatzisPNH99>
rdfs:seeAlso <https://doi.org/10.1023/A:1008340925177>
dc:subject built-in self test; delay fault testing; stuck-open fault testing; two-pattern testing (xsd:string)
dc:title An Accumulator-Based BIST Approach for Two-Pattern Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 15 (xsd:string)