Enhanced Reduced Pin-Count Test for Full-Scan Design.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/VrankenWFL02
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/VrankenWFL02
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/David_Lelouvier
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/H%E2%88%9A%C2%A9rv%E2%88%9A%C2%A9_Fleury
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Harald_P._E._Vranken
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tom_Waayers
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1023%2FA%3A1014989408897
>
foaf:
homepage
<
https://doi.org/10.1023/A:1014989408897
>
dc:
identifier
DBLP journals/et/VrankenWFL02
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1023%2FA%3A1014989408897
(xsd:string)
dcterms:
issued
2002
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/et
>
rdfs:
label
Enhanced Reduced Pin-Count Test for Full-Scan Design.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/David_Lelouvier
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/H%E2%88%9A%C2%A9rv%E2%88%9A%C2%A9_Fleury
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Harald_P._E._Vranken
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tom_Waayers
>
swrc:
number
2
(xsd:string)
swrc:
pages
129-143
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/et/VrankenWFL02/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/et/VrankenWFL02
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/et/et18.html#VrankenWFL02
>
rdfs:
seeAlso
<
https://doi.org/10.1023/A:1014989408897
>
dc:
subject
design for testability; reduced pin-count test; boundary-scan test; scan test; core test; ATE
(xsd:string)
dc:
title
Enhanced Reduced Pin-Count Test for Full-Scan Design.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
18
(xsd:string)