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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/WangC07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhanglei_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-0550-z>
foaf:homepage <https://doi.org/10.1007/s10836-006-0550-z>
dc:identifier DBLP journals/et/WangC07 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-006-0550-z (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishnendu_Chakrabarty>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhanglei_Wang>
swrc:number 2-3 (xsd:string)
swrc:pages 145-161 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/WangC07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/WangC07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et23.html#WangC07>
rdfs:seeAlso <https://doi.org/10.1007/s10836-006-0550-z>
dc:subject nanotechnology; nanofabric; BIST; defect tolerance; molecular electronics; CAEN; chemically assembled; reconfiguration (xsd:string)
dc:title Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 23 (xsd:string)