A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/WangKFICT05
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2005
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A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices.
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timing specifications testing; test environment; yield analysis; tester OTA and yield; high-speed interconnect testing
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A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices.
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