A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/WangWLWTCL02
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2002
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A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM.
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637-647
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dc:
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memory BIST; memory diagnostics; memory testing; RAM; semiconductor memory
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A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM.
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