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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/WegenerK06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Carsten_Wegener>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Peter_Kennedy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-9457-y>
foaf:homepage <https://doi.org/10.1007/s10836-006-9457-y>
dc:identifier DBLP journals/et/WegenerK06 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-006-9457-y (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Test Development Through Defect and Test Escape Level Estimation for Data Converters. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Carsten_Wegener>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Peter_Kennedy>
swrc:number 4-6 (xsd:string)
swrc:pages 313-324 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/WegenerK06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/WegenerK06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et22.html#WegenerK06>
rdfs:seeAlso <https://doi.org/10.1007/s10836-006-9457-y>
dc:subject mixed-signal and analog test; economics of test; test and post-test data analysis (xsd:string)
dc:title Test Development Through Defect and Test Escape Level Estimation for Data Converters. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)