[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/WenMSKWSK08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kohei_Miyase>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Laung-Terng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seiji_Kajihara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tatsuya_Suzuki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoqing_Wen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-007-5033-3>
foaf:homepage <https://doi.org/10.1007/s10836-007-5033-3>
dc:identifier DBLP journals/et/WenMSKWSK08 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-007-5033-3 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kewal_K._Saluja>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kohei_Miyase>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kozo_Kinoshita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Laung-Terng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seiji_Kajihara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tatsuya_Suzuki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoqing_Wen>
swrc:number 4 (xsd:string)
swrc:pages 379-391 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/WenMSKWSK08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/WenMSKWSK08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et24.html#WenMSKWSK08>
rdfs:seeAlso <https://doi.org/10.1007/s10836-007-5033-3>
dc:subject At-speed scan testing; Capture switching activity; X-filling; Test cube; ATPG; Low power testing (xsd:string)
dc:title Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 24 (xsd:string)