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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/WuLWCA00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Magdy_S._Abadir>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ming_Shae_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wen_Ching_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1023%2FA%3A1008365428314>
foaf:homepage <https://doi.org/10.1023/A:1008365428314>
dc:identifier DBLP journals/et/WuLWCA00 (xsd:string)
dc:identifier DOI doi.org%2F10.1023%2FA%3A1008365428314 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Oscillation Ring Delay Test for High Performance Microprocessors. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chung-Len_Lee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jwu_E._Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Magdy_S._Abadir>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ming_Shae_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wen_Ching_Wu>
swrc:number 1-2 (xsd:string)
swrc:pages 147-155 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/WuLWCA00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/WuLWCA00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et16.html#WuLWCA00>
rdfs:seeAlso <https://doi.org/10.1023/A:1008365428314>
dc:subject oscillation ring testing; delay fault testing; sensitized path; gate delay fault; robust path dealy fault; stuck at fault; hazard-free path delay fault; multiple reconvergent fanout; flunk lines (xsd:string)
dc:title Oscillation Ring Delay Test for High Performance Microprocessors. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 16 (xsd:string)