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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/WuM94>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Angus_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jack_L._Meador>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00971959>
foaf:homepage <https://doi.org/10.1007/BF00971959>
dc:identifier DBLP journals/et/WuM94 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00971959 (xsd:string)
dcterms:issued 1994 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Measurement selection for parametric IC fault diagnosis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Angus_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jack_L._Meador>
swrc:number 1 (xsd:string)
swrc:pages 9-18 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/WuM94/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/WuM94>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et5.html#WuM94>
rdfs:seeAlso <https://doi.org/10.1007/BF00971959>
dc:subject Measurement selection; parametric IC fault diagnosis; pattern classification (xsd:string)
dc:title Measurement selection for parametric IC fault diagnosis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 5 (xsd:string)