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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/X23>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-023-06049-8>
foaf:homepage <https://doi.org/10.1007/s10836-023-06049-8>
dc:identifier DBLP journals/et/X23 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-023-06049-8 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Journal of Electronic Testing: Theory and Applications New Editors - 2023. (xsd:string)
swrc:month February (xsd:string)
swrc:number 1 (xsd:string)
swrc:pages 3-4 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/X23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/X23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et39.html#X23>
rdfs:seeAlso <https://doi.org/10.1007/s10836-023-06049-8>
dc:title Journal of Electronic Testing: Theory and Applications New Editors - 2023. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)