[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/XiaoZWLLH22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chong_Hu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ke_Liu_0005>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qiong_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yanjun_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yindong_Xiao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yutong_Zeng>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-022-06009-8>
foaf:homepage <https://doi.org/10.1007/s10836-022-06009-8>
dc:identifier DBLP journals/et/XiaoZWLLH22 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-022-06009-8 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chong_Hu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ke_Liu_0005>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qiong_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yanjun_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yindong_Xiao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yutong_Zeng>
swrc:number 3 (xsd:string)
swrc:pages 279-288 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/XiaoZWLLH22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/XiaoZWLLH22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et38.html#XiaoZWLLH22>
rdfs:seeAlso <https://doi.org/10.1007/s10836-022-06009-8>
dc:title Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 38 (xsd:string)