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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/XuanSC06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiangdong_Xuan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-006-9498-2>
foaf:homepage <https://doi.org/10.1007/s10836-006-9498-2>
dc:identifier DBLP journals/et/XuanSC06 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-006-9498-2 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiangdong_Xuan>
swrc:number 4-6 (xsd:string)
swrc:pages 471-482 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/XuanSC06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/XuanSC06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et22.html#XuanSC06>
rdfs:seeAlso <https://doi.org/10.1007/s10836-006-9498-2>
dc:subject IC reliability; interconnect; reliability simulation; design for reliability; defect modeling; electromigration (xsd:string)
dc:title Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)