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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ZhangLJX18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianhui_Jiang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jie_Xiao_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Li_Ling>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ying_Zhang_0040>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-018-5733-x>
foaf:homepage <https://doi.org/10.1007/s10836-018-5733-x>
dc:identifier DBLP journals/et/ZhangLJX18 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-018-5733-x (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianhui_Jiang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jie_Xiao_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Li_Ling>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ying_Zhang_0040>
swrc:number 4 (xsd:string)
swrc:pages 447-460 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ZhangLJX18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ZhangLJX18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et34.html#ZhangLJX18>
rdfs:seeAlso <https://doi.org/10.1007/s10836-018-5733-x>
dc:title Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 34 (xsd:string)