Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/et/ZhangLJX18
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/et/ZhangLJX18
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jianhui_Jiang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jie_Xiao_0003
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Li_Ling
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ying_Zhang_0040
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2Fs10836-018-5733-x
>
foaf:
homepage
<
https://doi.org/10.1007/s10836-018-5733-x
>
dc:
identifier
DBLP journals/et/ZhangLJX18
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1007%2Fs10836-018-5733-x
(xsd:string)
dcterms:
issued
2018
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/et
>
rdfs:
label
Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jianhui_Jiang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jie_Xiao_0003
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Li_Ling
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ying_Zhang_0040
>
swrc:
number
4
(xsd:string)
swrc:
pages
447-460
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/et/ZhangLJX18/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/et/ZhangLJX18
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/et/et34.html#ZhangLJX18
>
rdfs:
seeAlso
<
https://doi.org/10.1007/s10836-018-5733-x
>
dc:
title
Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
34
(xsd:string)