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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ZhangM95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jon_C._Muzio>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shujian_Zhang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00993090>
foaf:homepage <https://doi.org/10.1007/BF00993090>
dc:identifier DBLP journals/et/ZhangM95 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00993090 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Evaluating the safety of self-checking circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jon_C._Muzio>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shujian_Zhang>
swrc:number 2 (xsd:string)
swrc:pages 243-253 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ZhangM95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ZhangM95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et6.html#ZhangM95>
rdfs:seeAlso <https://doi.org/10.1007/BF00993090>
dc:subject fail-safe evaluation; Markov model; self-checking circuit; TSC (xsd:string)
dc:title Evaluating the safety of self-checking circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 6 (xsd:string)