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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ZhangMP93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_D._McLeod>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Witold_Pedrycz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zaifu_Zhang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2FBF00971972>
foaf:homepage <https://doi.org/10.1007/BF00971972>
dc:identifier DBLP journals/et/ZhangMP93 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2FBF00971972 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label A neural network algorithm for testing stuck-open faults in CMOS combinational circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_D._McLeod>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Witold_Pedrycz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zaifu_Zhang>
swrc:number 3 (xsd:string)
swrc:pages 225-235 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ZhangMP93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ZhangMP93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et4.html#ZhangMP93>
rdfs:seeAlso <https://doi.org/10.1007/BF00971972>
dc:subject Neural networks; stuck-open and gate delay faults; test pattern generation (xsd:string)
dc:title A neural network algorithm for testing stuck-open faults in CMOS combinational circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 4 (xsd:string)