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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/et/ZhaoKKKWKNHSIOI22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anna_Kuwana>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haruo_Kobayashi_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jianglin_Wei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazumi_Hatayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keno_Sato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kentaroh_Katoh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shogo_Katayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Ishida_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Nakatani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tamotsu_Ichikawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshiyuki_Okamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yujie_Zhao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10836-022-05988-y>
foaf:homepage <https://doi.org/10.1007/s10836-022-05988-y>
dc:identifier DBLP journals/et/ZhaoKKKWKNHSIOI22 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10836-022-05988-y (xsd:string)
dcterms:issued 2022 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/et>
rdfs:label Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anna_Kuwana>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haruo_Kobayashi_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jianglin_Wei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazumi_Hatayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keno_Sato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kentaroh_Katoh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shogo_Katayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Ishida_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takayuki_Nakatani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tamotsu_Ichikawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshiyuki_Okamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yujie_Zhao>
swrc:number 1 (xsd:string)
swrc:pages 21-38 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/et/ZhaoKKKWKNHSIOI22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/et/ZhaoKKKWKNHSIOI22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/et/et38.html#ZhaoKKKWKNHSIOI22>
rdfs:seeAlso <https://doi.org/10.1007/s10836-022-05988-y>
dc:title Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 38 (xsd:string)