Saidoyoki: Evaluating side-channel leakage in pre- and post-silicon setting.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/iacr/KiaeiLEYS21
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Saidoyoki: Evaluating side-channel leakage in pre- and post-silicon setting.
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Saidoyoki: Evaluating side-channel leakage in pre- and post-silicon setting.
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