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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/iacr/OFlynn20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Colin_O%27Flynn>
foaf:homepage <https://eprint.iacr.org/2020/937>
dc:identifier DBLP journals/iacr/OFlynn20 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/iacr>
rdfs:label BAM BAM!! On Reliability of EMFI for in-situ Automotive ECU Attacks. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Colin_O%27Flynn>
swrc:pages 937 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/iacr/OFlynn20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/iacr/OFlynn20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/iacr/iacr2020.html#OFlynn20>
rdfs:seeAlso <https://eprint.iacr.org/2020/937>
dc:title BAM BAM!! On Reliability of EMFI for in-situ Automotive ECU Attacks. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 2020 (xsd:string)