Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ibmrd/Srinivasan96
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/ibmrd/Srinivasan96
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/G._R._Srinivasan
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1147%2Frd.401.0077
>
foaf:
homepage
<
https://doi.org/10.1147/rd.401.0077
>
dc:
identifier
DBLP journals/ibmrd/Srinivasan96
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1147%2Frd.401.0077
(xsd:string)
dcterms:
issued
1996
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/ibmrd
>
rdfs:
label
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/G._R._Srinivasan
>
swrc:
number
1
(xsd:string)
swrc:
pages
77-90
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/ibmrd/Srinivasan96/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/ibmrd/Srinivasan96
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/ibmrd/ibmrd40.html#Srinivasan96
>
rdfs:
seeAlso
<
https://doi.org/10.1147/rd.401.0077
>
dc:
title
Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
40
(xsd:string)