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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/iee-sej/BurgessD84>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._Burgess>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Robert_I._Damper>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1049%2Fsm.1984.0011>
foaf:homepage <https://doi.org/10.1049/sm.1984.0011>
dc:identifier DBLP journals/iee-sej/BurgessD84 (xsd:string)
dc:identifier DOI doi.org%2F10.1049%2Fsm.1984.0011 (xsd:string)
dcterms:issued 1984 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/iee-sej>
rdfs:label The inadequacy of the stuck-at fault model for testing mos lsi circuits: a review of mos failure mechanisms and some implications for computer-aided design and test of mos lsi circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._Burgess>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Robert_I._Damper>
swrc:number 2 (xsd:string)
swrc:pages 30-36 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/iee-sej/BurgessD84/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/iee-sej/BurgessD84>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/iee-sej/iee-sm3.html#BurgessD84>
rdfs:seeAlso <https://doi.org/10.1049/sm.1984.0011>
dc:title The inadequacy of the stuck-at fault model for testing mos lsi circuits: a review of mos failure mechanisms and some implications for computer-aided design and test of mos lsi circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 3 (xsd:string)