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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieeemm/WangZLGBY24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hezhen_You>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hongyan_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qianhe_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Song_Bai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Gong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xin_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMMUL.2024.3359267>
foaf:homepage <https://doi.org/10.1109/MMUL.2024.3359267>
dc:identifier DBLP journals/ieeemm/WangZLGBY24 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMMUL.2024.3359267 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieeemm>
rdfs:label You-Only-Look-Once Multiple-Strategy Printed Circuit Board Defect Detection Model. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hezhen_You>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hongyan_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qianhe_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Song_Bai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Gong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xin_Wang>
swrc:month January - March (xsd:string)
swrc:number 1 (xsd:string)
swrc:pages 76-87 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieeemm/WangZLGBY24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieeemm/WangZLGBY24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieeemm/ieeemm31.html#WangZLGBY24>
rdfs:seeAlso <https://doi.org/10.1109/MMUL.2024.3359267>
dc:title You-Only-Look-Once Multiple-Strategy Printed Circuit Board Defect Detection Model. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 31 (xsd:string)