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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieiceee/IshidoMKUIU07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daisuke_Ueda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hisayoshi_Matsuo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaoru_Inoue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuma_Katayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Teruki_Ishido>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tetsuzo_Ueda>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Felex.4.775>
foaf:homepage <https://doi.org/10.1587/elex.4.775>
dc:identifier DBLP journals/ieiceee/IshidoMKUIU07 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Felex.4.775 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieiceee>
rdfs:label Depth profiles of strain in AlGaN/GaN heterostructures grown on Si characterized by electron backscatter diffraction technique. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daisuke_Ueda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hisayoshi_Matsuo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaoru_Inoue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuma_Katayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Teruki_Ishido>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tetsuzo_Ueda>
swrc:number 24 (xsd:string)
swrc:pages 775-781 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieiceee/IshidoMKUIU07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieiceee/IshidoMKUIU07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee4.html#IshidoMKUIU07>
rdfs:seeAlso <https://doi.org/10.1587/elex.4.775>
dc:title Depth profiles of strain in AlGaN/GaN heterostructures grown on Si characterized by electron backscatter diffraction technique. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 4 (xsd:string)