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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieiceee/LeiWLL10a>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Feng_Liang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shaochong_Lei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zeye_Liu_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhen_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Felex.7.1364>
foaf:homepage <https://doi.org/10.1587/elex.7.1364>
dc:identifier DBLP journals/ieiceee/LeiWLL10a (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Felex.7.1364 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieiceee>
rdfs:label A unified solution to reduce test power and test volume for Test-per-scan schemes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Feng_Liang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shaochong_Lei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zeye_Liu_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhen_Wang>
swrc:number 18 (xsd:string)
swrc:pages 1364-1369 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieiceee/LeiWLL10a/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieiceee/LeiWLL10a>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee7.html#LeiWLL10a>
rdfs:seeAlso <https://doi.org/10.1587/elex.7.1364>
dc:title A unified solution to reduce test power and test volume for Test-per-scan schemes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 7 (xsd:string)