Development of multi-stage optical variable attenuator system and its control method for wafer inspection system.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ieiceee/NagashimaK23
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/ieiceee/NagashimaK23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hisaaki_Kanai
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tomoharu_Nagashima
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1587%2Felex.20.20230298
>
foaf:
homepage
<
https://doi.org/10.1587/elex.20.20230298
>
dc:
identifier
DBLP journals/ieiceee/NagashimaK23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1587%2Felex.20.20230298
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/ieiceee
>
rdfs:
label
Development of multi-stage optical variable attenuator system and its control method for wafer inspection system.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hisaaki_Kanai
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tomoharu_Nagashima
>
swrc:
number
17
(xsd:string)
swrc:
pages
20230298
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/ieiceee/NagashimaK23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/ieiceee/NagashimaK23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee20.html#NagashimaK23
>
rdfs:
seeAlso
<
https://doi.org/10.1587/elex.20.20230298
>
dc:
title
Development of multi-stage optical variable attenuator system and its control method for wafer inspection system.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
20
(xsd:string)