Atomistic study of SiN based ReRAM with high program/erase cycle endurance. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Hiroki_Shirakawa>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Keita_Yamaguchi>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Kenji_Shiraishi>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1587%2Felex.15.20180868>
foaf:homepage	<https://doi.org/10.1587/elex.15.20180868>
dc:identifier	DBLP journals/ieiceee/YamaguchiSS18 (xsd:string)
dc:identifier	DOI doi.org%2F10.1587%2Felex.15.20180868 (xsd:string)
dcterms:issued	2018 (xsd:gYear)
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rdfs:label	Atomistic study of SiN based ReRAM with high program/erase cycle endurance. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Hiroki_Shirakawa>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Keita_Yamaguchi>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Kenji_Shiraishi>
swrc:number	23 (xsd:string)
swrc:pages	20180868 (xsd:string)
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/ieiceee/ieiceee15.html#YamaguchiSS18>
rdfs:seeAlso	<https://doi.org/10.1587/elex.15.20180868>
dc:title	Atomistic study of SiN based ReRAM with high program/erase cycle endurance. (xsd:string)
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