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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/AbeYSNMF12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Akira_Matsumoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Akiyoshi_Fukui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masahito_Shoyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seiya_Abe>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sihun_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tamotsu_Ninomiya>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Ftranscom.E95.B.1990>
foaf:homepage <https://doi.org/10.1587/transcom.E95.B.1990>
dc:identifier DBLP journals/ieicet/AbeYSNMF12 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Ftranscom.E95.B.1990 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Malfunction Issue of SiC-SIT Based DC Circuit Breaker in 400 V DC Power Distribution Systems for Data Centers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Akira_Matsumoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Akiyoshi_Fukui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masahito_Shoyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seiya_Abe>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sihun_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tamotsu_Ninomiya>
swrc:number 6 (xsd:string)
swrc:pages 1990-1996 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/AbeYSNMF12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/AbeYSNMF12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet95b.html#AbeYSNMF12>
rdfs:seeAlso <https://doi.org/10.1587/transcom.E95.B.1990>
dc:title Malfunction Issue of SiC-SIT Based DC Circuit Breaker in 400 V DC Power Distribution Systems for Data Centers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 95-B (xsd:string)